Calculations of GE-XRF & GI-XRF Intensity

• Single Layer GE-XRF

• Single Layer GI-XRF

• Double Layer GE-XRF

• Double Layer GI-XRF

• Implants with Gaussian profile GE-XRF

• Implants with Gaussian profile GI-XRF

You can use links above to calculate fluorescent intensity as a function of the grazing exit or glansing incident angle

Related papers (please refer the following papers when you use the results obtained by this program)

• K. Tsuji and K. Hirokawa, Takeoff angle-dependent x-ray fluorescence of layered materials using a glancing incident x-ray beam, J. Appl. Phys., 75, 7189-7194 (1994).
• A. Okhrimovskyy, K. Tsuji, Numerical approach for depth profiling with GE-XRF, X-Ray Spectrom., 35, 305-311 (2006)