Grazing-Exit XRS (GE-XRS)geepma

  1. T. Awane, S. Fukuoka, K. Nakamachi, K. Tsuji, Grazing Exit Micro X-ray Fluorescence Analysis of Hazardous Metal Attached to a Plant Leaf Surface Using an X-ray Absorber Method,  Anal. Chem., 81 (2009) 3356-3364.
  2. J. Yang, K. Tsuji, X. Lin, D. Han, X. Ding, A micro x-ray fluorescence analysis method using polycapillary x-ray optics and grazing exit geometry, Thin Solid Films, 517 (2009) 3357-3361.
  3. T. Awane, K. Nakamachi, K. Tsuji, Effects of an X-ray absorber in grazing exit micro x-ray fluorescence analysis of arsenic attached to an aqueous leaf of Cammelia hiemalis, e-Journal of Surface Science and Nanotechnology, 7 (2009) 841-846.
  4. J. Yang, K. Tsuji, D. Han, and X. Ding, GE-MXRF analysis of multilayer films, X-Ray Spectrom., 37, 625-628 (2008).
  5. T. Tetsuoka, T. Nagamura, K. Tsuji, Improvement of reproducibility in grazing-exit EPMA (GE-EPMA), X-Ray Spectrom., 35(2006)89-92.
  6. Andriy Okhrimovskyy, K. Tsuji, Numerical approach for depth profiling with GE-XRF, X-Ray Spectrom., 35 (2006)305-311.
  7.  K. Tsuji, Grazing-exit electron probe x-ray microanalysis (GE-EPMA): Fundamental and applications (Review article), Spectrochim. Acta, B, 60(2005)1381-1391.
  8. Z. Spolnik, K. Tsuji, R. Van Grieken, Grazing-exit electron electron probe probe x-ray micro analysis of light elements, X-Ray Spectrom., 33 (2004)16-20.
  9. K. Tsuji, K. Tetsuoka, F. Delalieux, S. Sato, Calculation of electron-induced x-ray intensities under grazing-exit conditions in particles , e-Journa of. Surface and Nanotechnology , 1(2003) 111-115.
  10. K. Tsuji, K. Saito, K. Asami, K. Wagatsuma, F. Delalieux, Z. Spolnik, Localized Thin-Film Analysis by Grazing-Exit EPMA (GE-EPMA), Spectrochim. Acta. B, 57(2002) 897-906.
  11.  Z. Spolnik, J. Zhang, K. Wagastuma, K. Tsuji, Grazing-exit electron probe x-ray microanalysis of ultra-thin films and single particles, Anal. Chim. Acta., 455(2002) 245-252.
  12. K. Tsuji, Z. Spolnik, K. Wagatsuma, Continuous x-ray background in grazing-exit electron probe x-ray microanalysis, Spectrochim. Acta, 56(2001) 2497-2504.
  13. K. Tsuji, Z. Spolnik, and T. Ashino, New experimental equipment for grazing-exit electron probe microanalysis (GE-EPMA), Rev. Sci. Instrum., 72 (2001) 3933-3936.
  14. Z. Spolnik, K. Tsuji, K. Saito, K. Asami, K. Wagatsuma, Quantitative analysis of metallic ultra-thin films by grazing-exit electron probe x-ray microanalysis, X-Ray Spectrometry, 31(2002)178-183.
  15. K. Tsuji, Z. Spolnik, K. Wagatsuma, S. Nagata, I. Satoh, Grazing-Exit X-Ray Spectrometry for Surface and Thin-Film Analyses, Anal. Sci., 17(2001) 145-148.
  16. K. Tsuji, Y. Murakami, K. Wagatsuma, G. Love, Surface Studies by Grazing-Exit Electron Probe Microanalysis (GE-EPMA), X-Ray Spectrometry, 30(2001)123-126.
  17. K. Tsuji, M. Huisman, Z. Spolnik, K. Wagatsuma, Y. Mori, R. E. Van Grieken, R. D. Vis, Comparison of grazing-exit particle-induced X-ray emission with other related methods, Spectrochim. Acta B, 55, 1009-1016 (2000).
  18. K. Tsuji, K. Wagatsuma, R. Nullens, and R. Van Grieken, Elemental X-ray images obtained by grazing-exit electron probe microanalysis (GE-EPMA), J. Anal. At. Spectrom., 14(1999) 1711-1713.
  19. K. Tsuji, Z. Spolnik, K. Wagatsuma, R. E. Van Grieken, R. D. Vis, Grazing-exit particle-induced X-ray emission analysis with extremely low background, Anal. Chem., 71(1999) 5033-5036.
  20. K. Tsuji, Z. Spolnik, K. Wagatsuma, J. Zhang, and R. Van Grieken, Enhancement of electron-induced X-ray intensity for single particles under grazing-exit conditions, Spectrochim. Acta B., 54(1999)1243-1251.
  21. K. Tsuji, K. Wagatsuma, R. Nullens, and R. Van Grieken, Grazing-exit electron probe microanalysis for surface and particle analysis, Anal. Chem., 71(1999) 2497-2501.