X-Ray SPMstm
- K. Tsuji, T. Emoto, Y. Matsuoka, Y. Miyatake, T. Nagamura, and X. Ding, Micro-XRF instrument developed in combination with atomic force microscope, Advances in X-ray Analysis, 48 (2005) 221-228.
- K. Tsuji, Emoto, Y Matsuoka, Y. Miyatake, T, Nagamura, X,Ding, Micro X-ray fluorescence instrument developed in combination with atomic force microscope, Powder Dittraction 20 (2005) 137-140.
- Y. Hasegawa, K. Tsuji, K. Nakayama, K. Wagatsuma, T. Sakurai, X-ray source combined ultrahigh-vacuum scanning tunneling microscopy for elemental analysis, J. Vac. Sci. Tech. B., 18 (2000) 2676-2680.
- K. Tsuji, K. Wagatsuma, K. Sugiyama, K. Hiraga, Y. Waseda, EXAFS- and XANES-like spectra obtained by x-ray excited scanning tunneling microscope tip current measurement, Surf. Interface Anal., 27 (1999) 132-135.
- K. Tsuji, Y. Hasegawa, K. Wagatsuma and T. Sakurai, Detection of x-ray induced current using a scanning tunneling microscope and its spatial mapping for elemental analysis, Jpn. J. Appl. Phys., 37 (1998) L1271-L1273.
- K. Tsuji, T. Nagamura, and K. Wagatsuma, Scanning tunneling microscope tip current excited by modulated x-rays, Jpn. J. Appl. Phys., 37 (1998) 2028-2032.
- K. Tsuji, K. Wagatsuma and K. Hirokawa, Characteristics of total reflection x-ray excited current detected with the tip of scanning tunneling microscope, Spectrochim. Acta B, 52 (1997) 855-860.
- K. Tsuji and K. Wagatsuma, Optimum gaseous pressure for the measurement of the x-ray excited scanning tunneling microscope tip current, Jpn. J. Appl. Phys., 36 (1997) 1264-1267.
- 辻 幸一、我妻 和明、X線照射下でのSTM観察と探針電流の測定、X線分析の進歩、 28 (1997) 289-300.
- K. Tsuji and K. Hirokawa, Characteristics of an x-ray-excited current detected with an STM tip, Rev. Sci. Instrum., 67 (1996) 3573-3577.
- 辻 幸一、広川 吉之助、STM装置を用いたX線励起電流の測定、表面科学、17 (1996) 161-166.
- K. Tsuji and K. Hirokawa, Glancing-incidence and takeoff x-ray fluorescence and scanning tunneling microscopy of thin films under x-ray irradiation, Surf. Interface Anal., 24 (1996) 286-289.
- K. Tsuji and K. Hirokawa, X-ray excited current detected with scanning tunneling microscope equipment, Jpn. J. Appl. Phys., 34 (1995) L1506-L1508.