Total reflection X-ray Fluorescence (TXRF)xrf

  1. 川又 誠也、今西 由紀子、中野 和彦、辻 幸一、「プラスチック試料からの溶出液中金属元素の全反射蛍光Ｘ線分析法」、X線分析の進歩、41 (2010) 185-193.
  2. 中村 卓也、松井 宏、川又 誠也、中野 和彦、片山 貴子、日野 雅之、鰐渕 英機、荒波 一史、山田 隆、辻 幸一、「血液中金属元素の全反射蛍光Ｘ線分析」、X線分析の進歩、40 (2009) 249-257.
  3. K. Tsuji, Y. Hanaoka, A. Hibara, M. Tokeshi, T. Kitamori, Total reflection X-ray fluorescence analysis with chemical microchip, Spectrochim. Acta B, 61(2006)389-392 .
  4. Andriy Okhrimovskyy, K. Saito, K. Tsuji, Theoretical characterization of reflector-assisted TXRF analysis, e-Journal of. Surface Science and Nanotechnology, 4(2006) 579-583 .
  5. K. Tsuji, M. Kawamata, Y. Nishida, K. Nakano, K. Sasaki, Micro Total Reflection X-ray Fluorescence (Micro-TXRF) Analysis, X-ray Spectrometry, 35 (2006) 375-378.
  6. K. Nakano, K. Tanaka, X. Ding, K. Tsuji, Development of a New TXRF Instrument using Polycapillary X-ray Lens, Spectrochim. Acta B, 61 (2006) 1105-1109.
  7. 辻　幸一、「蛍光X線分析における近年の要素技術の進歩と特殊な測定方法」、X線分析の進歩、36(2005) 63-74.
  8. 松岡代志子、細川好則、日野雅之、辻　幸一、全反射蛍光Ｘ線分析のための血液試料サンプリング方法の検討、分析化学、54 (2005) 749-754.
  9. 中田　宗寛、辻　幸一、全反射蛍光X線分析のためのグロー放電スパッタリングによる試料作製、J. Surf. Anal., 12(2005) 303-307.
  10. 辻　幸一、反射板を利用した全反射蛍光Ｘ線分析の基礎検討、Ｘ線分析の進歩、35(2004) 193-200.
  11. K. Tsuji, F. Delalieux,Characterization of X-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis, X-Ray Spectrom.,33(2004) 281-284.
  12. J. Injuk, J. Osán, R. Van Grieken, K. Tsuji, Airborne particles in the Miyagi Museum of Art in Sendai, Japan, Studied by Electron Probe X-Ray Microanalysis and Energy Dispersive X-Ray Fluorescence Analysis, Anal. Sci. , 18(2002)561-566.
  13. K. Tsuji, K. Wagatsuma, Enhancement of TXRF Intensity by Using a Reflector, X-Ray Spectrom. 31(2002) 358-362.
  14. K. Tsuji, T. Sato, K. Wagatsuma, M. Claes, and R. Van Grieken, Preliminary experiment of total reflection x-ray fluorescence using two glancing x-ray beams excitation, Rev. Sci. Instrum., 70(1999)1621-1623.
  15. K. Tsuji, H. Takenaka, K. Wagatsuma, P. K. de Bokx and R. E. Van Grieken, Enhancement of X-ray fluorescence intensity from ultra-thin Ni layer sandwiched with carbon layers at grazing-emission angles, Spectrochim. Acta B, 54(1999)1881-1888.
  16. K. Tsuji, T. Sato and K. Wagatsuma, X-ray fluorescence analysis by multiple-glancing x-ray beam excitation, Jpn. J. Appl. Phys., 37 (1998)5821-5822.
  17. 辻 幸一、我妻 和明、全反射Ｘ線侵入深さの評価、表面科学、18(1997) 424-428.
  18. K. Tsuji, K. Wagatsuma, K. Hirokawa, T. Yamada, and T. Utaka, Development of the glancing-incidence and -takeoff x-ray fluorescence analysis, Spectrochim. Acta B, 52(1997) 841-846.
  19. K. Tsuji, K. Wagatsuma and K. Oku, Experimental evaluation of the Mo Ka x-ray penetration depth for a GaAs wafer in a total reflection x-ray fluorescence analysis, Anal. Sci., 13(1997) 351-354.
  20. K. Tsuji, K. Wagatsuma and K. Hirokawa, Takeoff angle-dependent x-ray fluorescence analysis of thin films on acrylic substrate, Journal of Trace and Microprobe Techniques, 15 (1997) 1-11.
  21. K. Tsuji and K. Hirokawa, Nondestructive depth profiling of oxidized Fe-Cr alloy by the glancing-incidence and -takeoff x-ray fluorescence method, Appl. Surf. Sci., 103(1996)451-458.
  22. K. Tsuji and K. Wagatsuma, Solid surface density determination using the glancing-takeoff x-ray fluorescence method, Jpn. J. Appl. Phys., 35(1996) L1535-L1537.
  23. K. Tsuji, S. Sato, and K. Hirokawa, Glancing-incidence and glancing-takeoff x-ray fluorescence analysis of a Mn ultrathin film on an Au layer, Thin Solid Films, 274 (1996)18-22.
  24. 辻 幸一、広川 吉之助、斜入射・斜出射－蛍光Ｘ線分析法による表面反応の評価、表面科学、17(1996)346-351.
  25. S. Sato, K. Tsuji, and K. Hirokawa, Evaluation of Ni/Mn multilayer samples with glancing-incidence and -takeoff x-ray fluorescence analysis, Appl. Phys. A, 62 (1996) 87-93.
  26. K. Tsuji, S. Sato, and K. Hirokawa, Depth profiling using the glancing-incidence and -takeoff x-ray fluorescence method, Rev. Sci. Instrum., 66(1995)4847-4852.
  27. K. Tsuji, T. Yamada, T. Utaka, and K. Hirokawa, The effects of surface roughness on the angle-dependent total-reflection x-ray fluorescence of ultrathin films, J. Appl. Phys., 78, 969-973 (1995).
  28. 辻 幸一、水戸瀬 賢悟、広川 吉之助、斜入射条件下における取り出し角依存-蛍光Ｘ線分析法による真空蒸着薄膜および溶液滴下-乾燥薄膜の分析、Ｘ線分析の進歩 , 26, 59-74 (1995).
  29. 辻 幸一、佐藤 成男、広川 吉之助、斜入射・斜出射-蛍光Ｘ線分析法による表面・薄膜分析、表面科学 , 15, 668-674 (1994).
  30. K. Tsuji, S. Sato, and K. Hirokawa, Surface-sensitive x-ray fluorescence analysis at glancing incident and takeoff angles, J. Appl. Phys., 76, 7860-7863 (1994).
  31. K. Tsuji, A. Sasaki, and K. Hirokawa, Effect of surface roughness on takeoff-angle-dependent x-ray fluorescence of ultrathin films at glancing incidence, Jpn. J. Appl. Phys., 33, 6316-6319 (1994).
  32. K. Tsuji, S. Sato, and K. Hirokawa, Characterization of Au thin film by Glancing-Incidence and -Takeoff X-Ray Fluorescence Spectroscopy, Jpn. J. Appl. Phys., 33, L1277-L1279 (1994).
  33. K. Tsuji and K. Hirokawa, Takeoff angle-dependent x-ray fluorescence of layered materials using a glancing incident x-ray beam, J. Appl. Phys., 75, 7189-7194 (1994).
  34. K. Tsuji and K. Hirokawa, Take-off angle-dependent x-ray fluorescence of thin films at glancing incidence, Spectrochim. Acta. B, 48, 1471-1480 (1993).

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